频域自相关变换
频域自相关变换* 使用自相关频域分析法分析wafer上的单个die的位置
* wafer是一种特殊的结构，相同的die重复出现的一个晶圆
*
dev_update_off ()
read_image (Wafer, 'wafer/wafer_dies')
get_image_size (Wafer, Width, Height)
dev_close_window ()
dev_open_window (0, 0, Width, Height, 'black', WindowHandle)
dev_display (Wafer)
*
* Compute the auto-correlation of the wafer image
* 时域到频域
rft_generic (Wafer, ImageFFT, 'to_freq', 'n', 'complex', Width)
correlation_fft (ImageFFT, ImageFFT, ImageCorrelation)
* 频域到时域
rft_generic (ImageCorrelation, ImageFFTInv, 'from_freq', 'n', 'real', Width)
*
* 计算相连dies之间的位置
local_max_sub_pix (ImageFFTInv, 'gauss', 3, 0.0001, Row, Column)
*
* 绘制第5个die到第6个die的距离图，第5个die到第9个die的距离图
I0 := 5
I1 := 6
I2 := 9
gen_arrow_contour_xld (Arrow, subset(Row,), subset(Column,), subset(Row,), subset(Column,), 15, 15)
gen_cross_contour_xld (Cross, Row, Column, 20, rad(45))
distance_pp (Row, Column, Row, Column, DistHor)
distance_pp (Row, Column, Row, Column, DistVert)
*
* Display the results
dev_display (Wafer)
disp_message (WindowHandle, ['Auto-correlation of the wafer image...','...corresponds to the die pitch'], 'image', 12, 12, 'black', 'true')
dev_set_color ('yellow')
dev_display (Arrow)
disp_message (WindowHandle, DistHor$ '.2f' + ' px', 'image', Row - 25, (Column + Column) * .5 - 50, 'yellow', 'false')
disp_message (WindowHandle, DistVert$ '.2f' + ' px', 'image', (Row + Row) * .5 - 15, Column - 100, 'yellow', 'false')
dev_set_color ('green')
dev_display (Cross)
参考：
【1】Halcon 例程学习之频域自相关变换（ correlation_fft）
【2】仿射变换：水平矫正
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